WS-14: Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements → Register Now
Subject: | Minimising Sources of Errors in Wafer-Level Measurements at Sub-mm Wave Frequencies: What we’ve learned so far |
Presenter: | Dr. Andrej Rumiantsev |
Time: | 9:00 - 9:30, Sunday, October 8 |
手机:18124783853
电话:025-52767811
邮箱:xch@m-test.cn
地点:南京市江宁区秣陵街道天元中路126号新城发展中心02幢902室(江宁开发区)