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EuMW – The 47th European Microwave Conference (EuMC)

2017-09-03

WS-14: Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements  Register Now



Subject:Minimising Sources of Errors in Wafer-Level Measurements at Sub-mm Wave Frequencies: What we’ve learned so far
Presenter:Dr. Andrej Rumiantsev
Time:9:00 - 9:30, Sunday, October 8


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