WS-14: Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements → Register Now
| Subject: | Minimising Sources of Errors in Wafer-Level Measurements at Sub-mm Wave Frequencies: What we’ve learned so far |
| Presenter: | Dr. Andrej Rumiantsev |
| Time: | 9:00 - 9:30, Sunday, October 8 |
手机：13728761743
电话：025-52767811
邮箱：xch@m-test.cn
地点：南京市江宁区东山街道新亭路126号广兴花园2幢108（高新园）