WS-14: Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements → Register Now
Subject: | Minimising Sources of Errors in Wafer-Level Measurements at Sub-mm Wave Frequencies: What we’ve learned so far |
Presenter: | Dr. Andrej Rumiantsev |
Time: | 9:00 - 9:30, Sunday, October 8 |
手机:13728761743
电话:025-52767811
邮箱:xch@m-test.cn
地点:南京市江宁区东山街道新亭路126号广兴花园2幢108(高新园)